Digital database of recently active traces of the Hayward Fault, California

Data Series 177
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Abstract

The purpose of this map is to show the location of and evidence for recent movement on active fault traces within the Hayward Fault Zone, California. The mapped traces represent the integration of the following three different types of data: (1) geomorphic expression, (2) creep (aseismic fault slip),and (3) trench exposures. This publication is a major revision of an earlier map (Lienkaemper, 1992), which both brings up to date the evidence for faulting and makes it available formatted both as a digital database for use within a geographic information system (GIS) and for broader public access interactively using widely available viewing software. The pamphlet describes in detail the types of scientific observations used to make the map, gives references pertaining to the fault and the evidence of faulting, and provides guidance for use of and limitations of the map. [Last revised Nov. 2008, a minor update for 2007 LiDAR and recent trench investigations; see version history below.]

Suggested Citation

Lienkaemper, J.J., 2006, Digital Database of Recently Active Traces of the Hayward Fault, California (ver. 1.1, November 2008): U.S Geological Survey Data Series 177, https://doi.org/10.3133/ds177.

ISSN: 2327-638X (online)

Study Area

Publication type Report
Publication Subtype USGS Numbered Series
Title Digital database of recently active traces of the Hayward Fault, California
Series title Data Series
Series number 177
DOI 10.3133/ds177
Edition Version 1.1, Revised November 14, 2008
Year Published 2006
Language English
Publisher U.S. Geological Survey
Publisher location Reston, VA
Contributing office(s) Earthquake Hazards Program, Earthquake Science Center
Description Report: 22 p.; Map; 24.00 x 36.00 inches; GIS Data Files; KMZ File
Country United States
State California
Other Geospatial Hayward Fault
Projection Universal Transverse Mercator
Online Only (Y/N) Y
Additional Online Files (Y/N) Y
Google Analytic Metrics Metrics page
Additional publication details