U.S. Geological Survey


SEM Results for Sample wtc01-36

Figure 1. Backscattered electron (top) and secondary electron (bottom) images of a bismuth-rich particle from sample 36.

See the detailed SEM sample report, click here. For more information contact:
Greg Meeker
gmeeker@usgs.gov

Backscattered electron and secondary electron images of a bismuth-rich particle from sample 36.


USA.gov logo