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(For further information on spectrsocopy, see:
http://speclab.cr.usgs.gov)
TITLE: Vesuvianite HS446 Idocrase DESCRIPT
DOCUMENTATION_FORMAT: MINERAL
SAMPLE_ID: HS446
MINERAL_TYPE: Cyclosilicate
MINERAL: Vesuvianite (Idocrase)
FORMULA: Ca10Mg2Al4(SiO4)5(Si2O7)2(OH)4
FORMULA_HTML: Ca10Mg2Al4(SiO4)5(Si2O7)2(OH)4
COLLECTION_LOCALITY: Maine
ORIGINAL_DONOR: Hunt and Salisbury Collection
CURRENT_SAMPLE_LOCATION: USGS Denver Spectroscopy Laboratory
ULTIMATE_SAMPLE_LOCATION: USGS Denver Spectroscopy Laboratory
SAMPLE_DESCRIPTION:
"S-6 Idocrase 446B--Maine. Ca10(MgFe)2Al4- (SiO4)5(Si2O7)2(OH)4: Idocrase is found in crystalline limestones as a result of contact metamorphism. The spectrum displays a weak but well resolved ferrous iron band at 9.95 µ, a weak ferric ion band near 0.75 µ, and the typical associated fall off in reflectivity to the blue. Very well resolved hydroxyl doubled features occur near 1.4 and 1.44 µ, and the weak 1.9 µ feature indicates some H2O. Combination OH bands occur near 2.2 and 2.37 µ. Note that these hydroxyl and water bands are located at their usual positions, unlike those displayed by other members of the epidote group. It is interesting that some authors (eg. Deer et al., 1963) do not include idocrase as a member of the epidote group, and the anomalous positions of its hydroxyl and water bands support this view."
Sieve interval 74 - 250µm.
Hunt, G.R., J.W. Salisbury, and C.J. Lenhoff, 1973, Visible and near-infrared spectra of minerals and rocks: VI. Additional silicates. Modern Geology, v. 4, p. 85-106.
END_SAMPLE_DESCRIPTION.
XRD_ANALYSIS:
40 kV - 30 mA, 6.5-9.5 keV
File: idoc446.out, -.mdi (smear mount of coarse material on quartz plate)
idoc446b.mdi (smear mount of finely ground material on quartz plate)
References: Borg and Smith (1969); JCPDS #38-437
Found: idocrase
Comment: Idocrase is well crystallized and appears to be the only phase.
The pattern of coarse material shows anomalous intensitites and some
d-spacings of the smaller peaks are significantly shifted from the
reference pattern. The pattern of fine material was refined
(without internal standard) to a=15.603(4) and c=11.766(4) ;
despite much peak overlap all observed reflections could be indexed
using the calculated list of permitted d-spacings.
J.S.Huebner, J. Pickrell, T.Schaefer, written communication (1994 USGS)
END_XRD_ANALYSIS.
COMPOSITIONAL_ANALYSIS_TYPE: None # XRF, EM(WDS), ICP(Trace), WChem
COMPOSITION_TRACE:
COMPOSITION_DISCUSSION:
END_COMPOSITION_DISCUSSION.
MICROSCOPIC_EXAMINATION:
END_MICROSCOPIC_EXAMINATION.
SPECTROSCOPIC_DISCUSSION:
END_SPECTROSCOPIC_DISCUSSION.
SPECTRAL_PURITY: 1a2_3_4_ # 1= 0.2-3, 2= 1.5-6, 3= 6-25, 4= 20-150 microns
| LIB_SPECTRA_HED: | where | Wave Range | Av_Rs_Pwr | Comment |
|---|---|---|---|---|
| LIB_SPECTRA: | splib04a r 5148 | 0.2-3.0µm | 200 | g.s.= |
| LIB_SPECTRA: | splib05a r 7014 | 0.2-3.0µm | 200 | g.s.= |
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