<?xml version='1.0' encoding='utf-8'?>
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:contributor>E.J. Dwornik</dc:contributor>
  <dc:contributor>H. J. Rose Jr.</dc:contributor>
  <dc:creator>I. Adler</dc:creator>
  <dc:date>1962</dc:date>
  <dc:description>Sulphur has been identified as one of the elements present in the contamination spot which forms under the electron beam in the microprobe. The presence of the sulphur results in a rapid change in intensity measurements causing a loss of observed intensity for elements other than sulphur. The source of sulphur has been traced at least in part to the Apiezon B diffusion pump oil. A comparative X-ray fluorescence study of the Apiezon B and Octoil diffusion pump oils showed substantial amounts of sulphur in the Apiezon B. The Octoil was relatively free of sulphur.</dc:description>
  <dc:format>application/pdf</dc:format>
  <dc:identifier>10.1088/0508-3443/13/5/314</dc:identifier>
  <dc:language>en</dc:language>
  <dc:title>The detection of sulphur in contamination spots in electron probe X-ray microanalysis</dc:title>
  <dc:type>article</dc:type>
</oai_dc:dc>