<?xml version='1.0' encoding='utf-8'?>
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:contributor>D.K. Fisler</dc:contributor>
  <dc:contributor>B.F. Bohor</dc:contributor>
  <dc:creator>A.J. Gratz</dc:creator>
  <dc:date>1996</dc:date>
  <dc:description>Multiple sets of crystallographically-oriented planar deformation features (PDFs) are generated by high-strain-rate shock waves at pressures of &gt; 12 GPa in naturally shocked quartz samples. On surfaces, PDFs appear as narrow (50-500 nm) lamellae filled with amorphosed quartz (diaplectic glass) which can be etched with hydrofluoric acid or with hydrothermal alkaline solutions. In contrast, slow-strain-rate tectonic deformation pressure produces wider, semi-linear and widely spaced arrays of dislocation loops that are not glass filled. Etching samples with HF before examination in a scanning electron microscope (SEM) allows for unambiguous visual distinction between glass-filled PDFs and glass-free tectonic deformation arrays in quartz. This etching also reveals the internal 'pillaring' often characteristic of shock-induced PDFs. This technique is useful for easily distinguishing between shock and tectonic deformation in quartz, but does not replace optical techniques for characterizing the shock features.</dc:description>
  <dc:format>application/pdf</dc:format>
  <dc:identifier>10.1016/0012-821X(96)00099-4</dc:identifier>
  <dc:language>en</dc:language>
  <dc:publisher>Elsevier</dc:publisher>
  <dc:title>Distinguishing shocked from tectonically deformed quartz by the use of the SEM and chemical etching</dc:title>
  <dc:type>article</dc:type>
</oai_dc:dc>