<?xml version='1.0' encoding='utf-8'?>
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:contributor>T. V. V. King</dc:contributor>
  <dc:contributor>Todd M. Hoefen</dc:contributor>
  <dc:creator>Raymond F. Kokaly</dc:creator>
  <dc:date>2011</dc:date>
  <dc:description>&lt;p&gt;&lt;span&gt;Identifying materials by measuring and analyzing their reflectance spectra has been an important method in analytical chemistry for decades. Airborne and space-based imaging spectrometers allow scientists to detect materials and map their distributions across the landscape. With new satellite-borne hyperspectral sensors planned for the future, for example, HYSPIRI (HYPerspectral InfraRed Imager), robust methods are needed to fully exploit the information content of hyperspectral remote sensing data. A method of identifying and mapping materials using spectral feature based analysis of reflectance data in an expert-system framework called MICA (Material Identification and Characterization Algorithm) is described in this paper. The core concepts and calculations of MICA are presented. A MICA command file has been developed and applied to map minerals in the full-country coverage of the 2007 Afghanistan HyMap hyperspectral data.&lt;/span&gt;&lt;/p&gt;</dc:description>
  <dc:format>application/pdf</dc:format>
  <dc:identifier>10.1109/IGARSS.2011.6049370</dc:identifier>
  <dc:language>en</dc:language>
  <dc:publisher>Institute of Electrical and Electronic Engineers</dc:publisher>
  <dc:title>Mapping the distribution of materials in hyperspectral data using the USGS Material Identification and Characterization Algorithm (MICA)</dc:title>
  <dc:type>text</dc:type>
</oai_dc:dc>