Open-File Report 02-227
Unique identifier (primary key) assigned by the authors of this paper.
Non-unique sample number assigned by the collecting laboratory.
Sample type; indicates the sample source, medium, and/or treatment. Unless otherwise noted, samples were collected and treated under the NURE HSSR program. See Data Quality: Sample Media for an in-depth discussion of sample types.
Name of the mineral-resource study under which the sample was analyzed.
Name of the 1° x 2° USGS quadrangle in which the sample was collected.
Longitude, in decimal degrees, of the sample site. Negative numbers indicate west longitudes. These values are assumed to be based upon the NAD27 Datum and Clarke 1866 Ellipsoid. Sample-site locations recorded by ORGDP commonly give values with 3 decimal places instead of the more common usage of 4 decimal places; therefore, the possible error of location is ±183 feet or ±55 meters.
Latitude, in decimal degrees, of the sample site. Positive numbers indicate north latitudes. These values are assumed to be based upon the NAD27 Datum and Clarke 1866 Ellipsoid. Sample-site locations recorded by ORGDP commonly give values with 3 decimal places instead of the more common usage of 4 decimal places; therefore, the possible error of location is ±183 feet or ±55 meters.
Elemental concentration of silver in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of silver in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of aluminum in percent, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of arsenic in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of arsenic in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of gold in parts per million, analyzed by graphite furnace atomic adsorption (O'Leary and Meier, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of barium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of beryllium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of bismuth in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of calcium in percent, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of cadmium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of cadmium in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of cerium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of cobalt in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of chromium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of copper in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of copper in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of iron in percent, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of gallium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of potassium in percent, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of lanthanum in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of lithium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of magnesium in percent, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of manganese in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of molybdenum in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of molybdenum in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of sodium in percent, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of niobium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of nickel in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of phosphorus in percent, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of lead in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of lead in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of antimony in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)
Elemental concentration of scandium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of tin in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of strontium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of thorium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of titanium in percent, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of vanadium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of yttrium in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of zinc in parts per million, analyzed by the ICP-40 method (Briggs, 1996).
Elemental concentration of zinc in parts per million, analyzed by the ICP-Partial method (Motooka, 1996). (ND = not determined, and indicates samples where there was insufficient material to perform ICP-partial analysis; B = no analytical value was reported, most commonly because of inter-element interferences.)