ASTER preflight and inflight calibration and the validation of level 2 products
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Abstract
Describes the preflight and inflight calibration approaches used for the Advanced Spaceborne Thermal Emission and Reflection Radiometer (ASTER). The system is a multispectral, high-spatial resolution sensor on the Earth Observing System's EOS-AM1 platform. Preflight calibration of ASTER uses well-characterized sources to provide calibration and preflight round-robin exercises to understand biases between the calibration sources of ASTER and other EOS sensors. These round-robins rely on well-characterized, ultra-stable radiometers. An experiment field in Yokohama, Japan, showed that the output from the source used for the visible and near-infrared (VNIR) subsystem of ASTER may be underestimated by 1.5%, but this is still within the 4% specification for the absolute, radiometric calibration of these bands. Inflight calibration will rely on vicarious techniques and onboard blackbodies and lamps. Vicarious techniques include ground-reference methods using desert and water sites. A recent joint field campaign gives confidence that these methods currently provide absolute calibration to better than 5%, and indications are that uncertainties less than the required 4% should be achievable at launch. The EOS-AM1 platform will also provide a spacecraft maneuver that will allow ASTER to see the Moon, allowing further characterization of the sensor. A method for combining the results of these independent calibration results is presented. The paper also describes the plans for validating the Level 2 data products from ASTER. These plans rely heavily upon field campaigns using methods similar to those used for the ground-reference, vicarious calibration methods.
Publication type | Article |
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Publication Subtype | Journal Article |
Title | ASTER preflight and inflight calibration and the validation of level 2 products |
Series title | IEEE Transactions on Geoscience and Remote Sensing |
DOI | 10.1109/36.701023 |
Volume | 36 |
Issue | 4 |
Year Published | 1998 |
Language | English |
Publisher | IEEE |
Description | 12 p. |
First page | 1161 |
Last page | 1172 |
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