Numerical modeling of magnetic moments for UXO applications
By: V. Sanchez, Y. Li, M. Nabighian, and D. Wright
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Abstract
The surface magnetic anomaly observed in UXO clearance is mainly dipolar and, consequently, the dipole is the only magnetic moment regularly recovered in UXO applications. The dipole moment contains information about intensity of magnetization but lacks information about shape. In contrast, higher-order moments, such as quadrupole and octupole, encode asymmetry properties of the magnetization distribution within the buried targets. In order to improve our understanding of magnetization distribution within UXO and non-UXO objects and its potential utility in UXO clearance, we present a 3D numerical modeling study for highly susceptible metallic objects. The basis for the modeling is the solution of a nonlinear integral equation describing magnetization within isolated objects. A solution for magnetization distribution then allows us to compute magnetic moments of the object, analyze their relationships, and provide a depiction of the surface anomaly produced by different moments within the object. Our modeling results show significant high-order moments for more asymmetric objects situated at depths typical of UXO burial, and suggest that the increased relative contribution to magnetic gradient data from these higher-order moments may provide a practical tool for improved UXO discrimination.
Suggested Citation
Sanchez, V., Li, Y., Nabighian, M., Wright, D., 2006, Numerical modeling of magnetic moments for UXO applications, in Proceedings of SPIE - The International Society for Optical Engineering, v. 6239, Kissimmee, FL, 17 April 2006 through 18 April 2006, https://doi.org/10.1117/12.664959.
| Publication type | Conference Paper |
|---|---|
| Publication Subtype | Conference Paper |
| Title | Numerical modeling of magnetic moments for UXO applications |
| ISBN | 0819462950; 9780819462954 |
| DOI | 10.1117/12.664959 |
| Volume | 6239 |
| Year Published | 2006 |
| Language | English |
| Larger Work Title | Proceedings of SPIE - The International Society for Optical Engineering |
| Conference Title | Targets and Backgrounds XII: Characterization and Representation |
| Conference Location | Kissimmee, FL |
| Conference Date | 17 April 2006 through 18 April 2006 |