Transitioning laser ablation ICP-MS from research applications to routine trace element microanalysis: A look at quantitative trace element analyses and imaging
Microscopy and Microanalysis
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Abstract
[No abstract available]
Suggested Citation
Koenig, A., 2009, Transitioning laser ablation ICP-MS from research applications to routine trace element microanalysis: A look at quantitative trace element analyses and imaging: Microscopy and Microanalysis, v. 15, no. SUPPL. 2, p. 536-537, https://doi.org/10.1017/S1431927609095282.
| Publication type | Article |
|---|---|
| Publication Subtype | Journal Article |
| Title | Transitioning laser ablation ICP-MS from research applications to routine trace element microanalysis: A look at quantitative trace element analyses and imaging |
| Series title | Microscopy and Microanalysis |
| DOI | 10.1017/S1431927609095282 |
| Volume | 15 |
| Issue | SUPPL. 2 |
| Publication Date | July 26, 2009 |
| Year Published | 2009 |
| Language | English |
| Larger Work Type | Article |
| Larger Work Subtype | Journal Article |
| Larger Work Title | Microscopy and Microanalysis |
| First page | 536 |
| Last page | 537 |