Surface electrical properties experiment
By: Gene Simmons, David Strangway, Peter Annan, Richard G. Baker, Lawrence Bannister, Raymond E. Brown, William Cooper, Dean Cubley, Joseph deBettencourt, Anthony W. England, John Groener, Jin-Au Kong, Gerald LaTorraca, James Meyer, Ved Nanda, David Redman, James Rossiter, Leung Tsang, Joseph Urner, and Raymond Watts
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- Document: Report
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Abstract
The surface electrical properties (SEP) experiment was used to explore the subsurface material of the Apollo 17 landing site by means of electromagnetic radiation. The experiment was designed to detect electrical layering, discrete scattering bodies, and the possible presence of water. From the analysis of the data, it was expected that values of the electrical properties (dielectric constant and loss tangent) of lunar material in situ would be obtained.
| Publication type | Book chapter |
|---|---|
| Publication Subtype | Book Chapter |
| Title | Surface electrical properties experiment |
| Series number | 330 |
| Year Published | 1973 |
| Contributing office(s) | Astrogeology Science Center |
| Description | 14 p. |
| Larger Work Type | Report |
| Larger Work Subtype | Federal Government Series |
| Larger Work Title | Apollo 17 preliminary science report (NASA SP-330) |
| First page | 15-1 |
| Last page | 15-14 |
| Other Geospatial | Moon |