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Abstract
We describe our initial experiences producing controlled digital elevation models (DEMs) of Mars with horizontal resolutions of ≤10 m and vertical precisions of ≤2 m. Such models are of intense interest at all phases of Mars exploration and scientific investigation, from the selection of safe landing sites to the quantitative analysis of the morphologic record of surface processes. Topomapping with a resolution adequate to address many of these issues has only become possible with the success of the Mars Global Surveyor (MGS) mission. The Mars Orbiter Laser Altimeter (MOLA) on MGS mapped the planet globally with absolute accuracies <10 m vertically and ~100 m horizontally but relatively sparse sampling (300 m along track, with gaps of >1 km between tracks common at low latitudes). We rely on the MOLA data as the best available source of control and process images from the narrow-angle Mars Orbiter Camera (MOC-NA) with stereo and photoclinometric (shape-from-shading) techniques to produce DEMs with significantly better horizontal resolution. The techniques described here enable mapping not only with MOC but also with the high-resolution cameras (Mars Express HRSC, Mars Reconnaissance Orbiter HiRISE) that will orbit Mars in the next several years.
Publication type | Conference Paper |
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Publication Subtype | Conference Paper |
Title | USGS high resolution topo-mapping of Mars with Mars Orbiter Camera Narrow-Angle images |
Year Published | 2002 |
Language | English |
Publisher | International Society for Photogrammetry and Remote Sensing |
Contributing office(s) | Astrogeology Science Center |
Description | 10 p.; DVD-ROM |
Larger Work Type | Book |
Larger Work Subtype | Conference publication |
Larger Work Title | Geospatial Theory, Processing and Applications: ISPRS Commission IV Proceedings |
Conference Title | Geospatial Theory, Processing and Applications: ISPRS Commission IV |
Conference Location | Ottawa, Canada |
Conference Date | July 9-12, 2002 |
Other Geospatial | Comet Borrelly |
Google Analytic Metrics | Metrics page |