Energy dispersive spectrometry for quantitative mineralogical analyses: An ancillary system on an electron microphobe
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Abstract
Investigation of the Li-drifted Si-semiconductor X-ray detector for quantitative elemental analysis of some common rock-forming minerals shows that amounts of certain major elements having K spectra in the energy range of about 1.74 (Si) to 8.64 (Zn) kiloelectronvolts may be accurately determined, if spectral interferences are absent. Elements in major concentrations between 0.5 and 1.00 percent may be analyzed quantitatively without corrections of K spectra X-ray intensities when reference standards of similar composition are used and significant K spectra interferences between two adjacent elements are absent. Elemental concentrations less than about 0.5 weight percent cannot be precisely determined from raw X-ray intensity data owing to high and variable spectral background. Data show that spectral background corrections are feasible because spectral background is a linear function for the light-element oxides and silicates. Simultaneous quantitative elemental analysis, with both the energy dispersive spectrometer and the conventional wavelength dispersive spectrometers on the electron microprobe, is feasible.
| Publication type | Article |
|---|---|
| Publication Subtype | Journal Article |
| Title | Energy dispersive spectrometry for quantitative mineralogical analyses: An ancillary system on an electron microphobe |
| Series title | Journal of Research of the U.S. Geological Survey |
| Volume | 2 |
| Issue | 4 |
| Year Published | 1974 |
| Language | English |
| Publisher | U. S. Geological Survey |
| Description | 6 p. |
| First page | 441 |
| Last page | 446 |
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