The detection of sulphur in contamination spots in electron probe X-ray microanalysis
British Journal of Applied Physics
By: I. Adler, E.J. Dwornik, and H. J. Rose Jr.
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Abstract
Sulphur has been identified as one of the elements present in the contamination spot which forms under the electron beam in the microprobe. The presence of the sulphur results in a rapid change in intensity measurements causing a loss of observed intensity for elements other than sulphur. The source of sulphur has been traced at least in part to the Apiezon B diffusion pump oil. A comparative X-ray fluorescence study of the Apiezon B and Octoil diffusion pump oils showed substantial amounts of sulphur in the Apiezon B. The Octoil was relatively free of sulphur.
Suggested Citation
Adler, I., Dwornik, E., Rose, H.J., 1962, The detection of sulphur in contamination spots in electron probe X-ray microanalysis: British Journal of Applied Physics, v. 13, no. 5, p. 245-246, https://doi.org/10.1088/0508-3443/13/5/314.
| Publication type | Article |
|---|---|
| Publication Subtype | Journal Article |
| Title | The detection of sulphur in contamination spots in electron probe X-ray microanalysis |
| Series title | British Journal of Applied Physics |
| DOI | 10.1088/0508-3443/13/5/314 |
| Volume | 13 |
| Issue | 5 |
| Publication Date | November 20, 2002 |
| Year Published | 1962 |
| Language | English |
| Larger Work Type | Article |
| Larger Work Subtype | Journal Article |
| Larger Work Title | British Journal of Applied Physics |
| First page | 245 |
| Last page | 246 |