Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis
Open-File Report
2005-1073
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Abstract
Suggested Citation
Lowers, H., Meeker, G.P., and Brownfield, I.K., 2005, Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis (Version 1.0; Supplement to OFR 2005-1031): U.S. Geological Survey Open-File Report 2005-1073, 11 p., https://doi.org/10.3133/ofr20051073.
ISSN: 2331-1258 (online)
| Publication type | Report |
|---|---|
| Publication Subtype | USGS Numbered Series |
| Title | Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis |
| Series title | Open-File Report |
| Series number | 2005-1073 |
| DOI | 10.3133/ofr20051073 |
| Edition | Version 1.0; Supplement to OFR 2005-1031 |
| Year Published | 2005 |
| Language | ENGLISH |
| Description | 11 p. |
| Scale | 24000 |